Home > News > 04.08 Obtiva Shares RCP Experience at EclipseCon 2008
Obtiva shares RCP experience at EclipseCon 2008
EclipseCon2008 is the premier technical and user conference for the Eclipse platform. Held this year at the Santa Clara Convention Center March 17-20, the conference will feature topics on everything Eclipse from mobile computing to Java, to C++, and open source.
Test-Driven Development (TDD) for Eclipse RCP
Kevin P. Taylor and Nicholaus Malnick co-presented this 2 hour tutorial that included:
Applying sensible TDD practices while writing Eclipse RCP applications
Pair programming with Kevin and Nick
Eclipse IDE and techniques demonstration that participants will leverage to write unit tests and make them pass
Additional topics such as user interface testing, Model View Presenter (MVP) vs. Model View Controller (MVC), databinding, PDEUnit, TPTP and automated acceptance testing will also be discussed
Creating Enterprise Business Applications Using Eclipse RCP
Kevin P. Taylor presented this 50 minute talk
This talk emerged out of Obtiva’s experiences gained while working on a large Eclipse RCP/J2EE enterprise application containing millions of lines of code. It will address the gap between the standard functionality of Eclipse RCP and what is needed for the creation of polished highly usable business applications. The talk included:
Dividing responsibilities between the RCP client and J2EE Server
Applying the MVP pattern to RCP client views facilitating easier unit testing
Eclipse Application Updating
Employing the JFace Databinding API to decouple models and UI widgets
Structuring form-level validation and error handling
Notification and synchronization of data between the client and server
Managing disconnected network functionality
Client side database strategies
JRuby on RCP
Andy Maleh presented this 10 minute lightning talk. Attendees:
Were introduced Glimmer
Gained knowledge of what JRuby and Glimmer provide over Java
Developed a solid understanding of how JRuby can improve maintainability and productivity while building RCP applications